The NIEER AVHRR snow cover extent product over China – a long-term daily snow record for regional climate research

Abstract. A long-term Advanced Very High Resolution Radiometer (AVHRR) snow cover extent (SCE) product from 1981 until 2019 over China has been generated by the research team in Northwest Institute of Eco-Environment and Resources (NIEER), Chinese Academy Sciences. The NIEER AVHRR SCE a spatial resolution 5 km daily temporal resolution, it is completely gap-free product, which produced through series processes such as quality control, cloud detection, discrimination, gap-filling (GF). comprehensive validation with reference to ground snow-depth measurements during seasons revealed overall accuracy 87.4 %, producer's was 81.0 user's 81.3 Cohen's kappa (CK) value 0.717. Another higher-resolution maps derived Landsat-5 Thematic Mapper (TM) images demonstrates an 87.3 86.7 95.7 0.695. These accuracies were significantly higher than those currently existing products. For example, compared well-known JASMES increased approximately 15 omission error dropped 60.8 % 19.7 commission 31.9 21.3 CK more 114 %. new already available at https://doi.org/10.11888/Snow.tpdc.271381 (Hao et al., 2021).